Acceleration Reliability Growth Tests under Double-stresses  
Author Jinyong Yao


Co-Author(s) Hao Wu; Yiliu Liu; Xiangfen Wang


Abstract For accelerated reliability growth tests (ARGT), the type of environmental stresses has a significant impact on the assessment of product reliability. To improve the efficiency of the product testing, shorten the development time, based on the single-stress accelerated reliability growth test, a double-stress accelerated reliability growth test method is developed based on Army Materials Systems Analysis Activity (AMSAA) growth model and Generalized Eyring accelerated model to solve the problem in converting the MTBF at different stress levels. The parameters of model are respectively estimated by the maximum likelihood method and the least squares estimation. At last, an example is given at the end of the paper for verifying the method.


Keywords Reliability growth test, ARGT method, AMSAA growth model, Generalized Eyring accelerated model
    Article #:  23-116
Proceedings of the 23rd ISSAT International Conference on Reliability and Quality in Design
August 3-5, 2017 - Chicago, Illinois, U.S.A.