A New Type of Skipping Lot Sampling Plan Based on Process Yield  
Author Chien-Wei Wu


Co-Author(s) Shih-Wen Liu


Abstract Accordingly, in this paper, we proposed a new variables SkSP-2Ls based on process yield, one of the most popular criteria used to judge the process or products to provide the users a better way to make a reliable and economical lot sentencing. The Markov chain approach is used to derive the OC function and the average sample number of the proposed method, and the plan parameters are solved under a designated minimization problem, which constrains two tolerable sampling risks and the corresponding acceptable quality levels. Computation results show that the proposed method outperforms the existing variables SkSP-2.


Keywords skip-lot sampling plan; lot determination; process yield; operating characteristic curve; Markov chain approach
    Article #:  DSBFI23-55
Proceedings of 2nd ISSAT International Conference on Data Science in Business, Finance and Industry
January 8-10, 2023 - Da Nang, Vietnam