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International Society of Science and Applied Technologies |
| Reliability Modeling for Shock-Degradation-Dependent Process Considering Damage Resistance | ||||
| Author | Yuhan Hu
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| Co-Author(s) | Mengmeng Zhu
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| Abstract | Damage-resistant systems are able to resist a certain level of damage from external shocks. Current studies commonly assumed all shocks have the same level of impact on the system degradation process; however, it may not be true for the damage-resistant system. In addition, the randomness induced by shocks and uncertainty of the application environments were not considered in the modeling of the system degradation process. In this paper, we first classify a shock based on its magnitude and then use the defined shock types to determine the damage resistance level of the system. A resistance factor is introduced to quantitatively measure the level of resistance. Furthermore, we use the Wiener process to model the system degradation process with randomness and different damage-resistant levels with respect to shock types. A closed-form reliability function is obtained from the Wiener process based degradation model. Finally, a simulation example is conducted to demonstrate the performance of the proposed reliability model.
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| Keywords | Reliability, damage resistance, degradation, random shocks, Wiener process | |||
| Article #: RQD27-154 | ||||
Proceedings of 27th ISSAT International Conference on Reliability & Quality in Design |