The Compound Class of Weibull Power Series for Reliability Application  
Author Minjae Park


Co-Author(s) Hoang Pham


Abstract In this study, we introduce a new class of distributions by compounding the exponentiated Weibull family and vtub-shaped failure rate for system. This combined class of distributions can be applied to reliability applications using the field data and mathematical properties of combined distributions are studied including order statistics. Using maximum likelihood estimation, point estimates and interval estimation for parameters have been obtained. We develop novel approach to measure reliability of parallel systems as well as single component system and illustrate the usefulness of proposed approach. Numerical examples are discussed for the applicability of the methodology derived in the paper.


Keywords Combined distribution; Maximum likelihood estimation; Multi-component system; Power series class; Reliability function; vtub-shaped failure rate
    Article #:  RQD25-272
Proceedings of 25th ISSAT International Conference on Reliability & Quality in Design
August 1-3, 2019 - Las Vegas, NV, U.S.A.