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International Society of Science and Applied Technologies |
| An Exploration of System Effective Apparent Activation Energy | ||||
| Author |
Fengbin Sun
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| Abstract | This paper attacks a long-time challenge in industry application and provides a physics-based exploration and modeling for system level thermal apparent activation energy when multiple independent components or competing failure modes are present under steady-state thermal stressing and each is governed by its own thermal activation energy and its own underlying Weibull life distribution.
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| Keywords | Thermal Apparent Activation Energy, System Reliability, Competing Failure Modes, Weibull | |||
| Article #: RQD2026-120 | ||||
Proceedings of 31st ISSAT International Conference on Reliability & Quality in Design |