Discrete Software Reliability Modeling Based on a Discrete Modified Weibull Distribution  
Author Yuki Hosokawa

 
Co-Author(s) Shinji Inoue; Shigeru Yamada

 
Abstract We propose a discrete Weibull-type software reliability growth model in order to improve the reliability evaluation accuracy based on Software Reliability Growth Model by applying a discrete reduced modified Weibull distribution, which has better fitting performance than the conventional discrete Weibull distribution to the software failure-occurrence distribution. Finally, we conduct goodness-of-fit comparisons of our model with existing model, and show the numerical examples of software reliability assessment based on our model by using actual data.

 
Keywords Software reliability assessment, Discrete software reliability growth model, Binomial distribution, Discrete reduced modified Weibull distribution, Hazard rate function
   
    Article #:  22176
 
Proceedings of the 22nd ISSAT International Conference on Reliability and Quality in Design
August 4-6, 2016 - Los Angeles, California, U.S.A.