International Society of Science and Applied Technologies |
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Extended Discrete Binomial Software Reliability Models with Test Environment | ||||
Author | Shinji Inoue
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Co-Author(s) | Shigeru Yamada
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Abstract | Considering an actual software testing phase, we have no doubt that the software reliability growth process depends on test environment factors, such as testing coverage, the number of test-runs and debugging skills, which affect the software failure occurrence or fault detection phenomenon in the testing phase. In this research, we propose a software reliability modeling approach that considers the effects of the testing environment factors based on a program size dependent discrete binomial-type software reliability model. Our models are also consistent with software reliability data collection and enable us to consider the effect of the program size. Finally, we compare the accuracy of our models in terms of mean square errors (MSE) and Akaike's information criterion (AIC) with the existing corresponding model by using actual data.
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Keywords | Software reliability model, Software reliability assessment, Test environment, Program size, Binomial process, Generalized linear modeling | |||
Article #: 22127 |
August 4-6, 2016 - Los Angeles, California, U.S.A. |