A Fatigue Life Prediction Model Based on Dual Effect of Low-amplitude Loads  
Author Songlin Zheng


Co-Author(s) Tie Chen; Jinzhi Feng; Honghai Wang


Abstract This paper presents a new fatigue life prediction methodology based on the random load spectrum. We first explore the strengthening effect of low-amplitude loads below the fatigue limit and derive out the new S-N curve. The effect of low-amplitude loads can be described as two parts which are strengthening and damaging. We then propose a fatigue life prediction model to determine the optimal strengthening cycles and the corresponding increase ratio of the fatigue strength. Finally the Miner rule is used to evaluate the damage accumulation. Two real-world experiments are conducted and the experimental results show that the proposed fatigue life prediction method obtain prediction results more accurately than other approaches.


Keywords Fatigue Life Prediction; Random Load Spectrum; Low-amplitude Loads; Strengthening and Damaging; Miner Rule
    Article #:  20156
Proceedings of the 20th ISSAT International Conference on Reliability and Quality in Design
August 7-9, 2014 - Seattle, Washington, U.S.A.