Optimal Reliability of Series and Parallel Systems subject to Two Failure Modes Considering Correlated Failures  
Author Anusha Krishna Murthy
Co-Author(s) Saikath Bhattacharya; Lance Fiondella
Abstract Most reliability models assume components and systems experience one failure mode. Several systems such as hardware, however, are prone to more than one mode of failure. Past two failure mode research derives equations to maximize reliability or minimize cost by identifying the optimal number of components. However, these equations are derived from models that make the simplifying assumption that components fail in a statistically independent manner. This paper develops models to assess the impact of correlation on two failure mode system reliability and derives corresponding expressions for optimal reliability designs. Our illustrations demonstrate that, despite correlation, the approach identifies reliability optimal designs.
Keywords Two failure modes, reliability block diagram, correlated failure, optimal design
   
    Article #:  23-249
 
Proceedings of the 23rd ISSAT International Conference on Reliability and Quality in Design
August 3-5, 2017 - Chicago, Illinois, U.S.A.