International Society of Science and Applied Technologies |
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A Novel Approach for Evaluating High-Quality Process Performance Based on the Quality-Yield Index | ||||
Author | Chien-Wei Wu
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Co-Author(s) | Armin Darmawan; Meng-Tzu Lin
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Abstract | In this research, a novel approach, called generalized confidence interval (GCI), is applied using the idea of generalized pivotal quantities to construct the confidence interval for the Q-yield index. To examine the performance of the proposed approach, a series of simulations are conducted and also compared with the existing method and three bootstrap methods in terms of coverage rate (CR) and the average value of lower confidence bound (LCB). Based on the findings, it can be concluded that the proposed GCI approach provides the most accurate results for constructing the LCB of the quality yield index. The proposed approach is therefore suggested in realworld scenarios to explore and evaluate process performance using the Q-yield index for the customer's high-quality requirement.
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Keywords | Generalized pivotal quantitiy; Coverage rate; Process yield; Quality loss function; Quality assurance | |||
Article #: DSBFI23-121 |
January 8-10, 2023 - Da Nang, Vietnam |